Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7710615
Preview
| Coordinates | 7710615.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C76 H84 S2 Si4 U |
|---|---|
| Calculated formula | C76 H84 S2 Si4 U |
| SMILES | [U]123456789%10(Sc%11c(c%12c(c(c%11c%11ccccc%11)c%11ccccc%11)C=C[C@@H]%11[C@H]%12C%11(c%11ccccc%11)c%11ccccc%11)[C]9(=[S]1)c1ccccc1)([c]1([Si](C)(C)C)[cH]2[c]%10([Si](C)(C)C)[cH]3[cH]41)[c]1([Si](C)(C)C)[cH]5[c]6([Si](C)(C)C)[cH]7[cH]81.c1ccccc1.c1ccccc1.[U]123456789%10(Sc%11c(c%12c(c(c%11c%11ccccc%11)c%11ccccc%11)C=C[C@H]%11[C@@H]%12C%11(c%11ccccc%11)c%11ccccc%11)[C]9(=[S]1)c1ccccc1)([c]1([Si](C)(C)C)[cH]2[c]%10([Si](C)(C)C)[cH]3[cH]41)[c]1([Si](C)(C)C)[cH]5[c]6([Si](C)(C)C)[cH]7[cH]81.c1ccccc1.c1ccccc1 |
| Title of publication | Intrinsic reactivity of [η<sup>5</sup>-1,3-(Me<sub>3</sub>Si)<sub>2</sub>C<sub>5</sub>H<sub>3</sub>]<sub>2</sub>U(η<sup>4</sup>-C<sub>4</sub>Ph<sub>2</sub>) in small molecule activation. |
| Authors of publication | Wang, Shichun; Heng, Yi; Li, Tongyu; Wang, Dongwei; Hou, Guohua; Zi, Guofu; Walter, Marc D. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2022 |
| Journal volume | 51 |
| Journal issue | 29 |
| Pages of publication | 11072 - 11085 |
| a | 12.5008 ± 0.0003 Å |
| b | 14.1759 ± 0.0003 Å |
| c | 19.8061 ± 0.0004 Å |
| α | 86.336 ± 0.002° |
| β | 88.711 ± 0.002° |
| γ | 78.197 ± 0.002° |
| Cell volume | 3428.45 ± 0.13 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.046 |
| Residual factor for significantly intense reflections | 0.0416 |
| Weighted residual factors for significantly intense reflections | 0.1067 |
| Weighted residual factors for all reflections included in the refinement | 0.1098 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.105 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7710615.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.