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Information card for entry 7711373
Preview
| Coordinates | 7711373.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H36 N2 Pt S |
|---|---|
| Calculated formula | C40 H36 N2 Pt S |
| SMILES | [Pt]12([n]3c(c4c2cccc4)cc(cc3c2[n]1c1ccccc1s2)c1cc(cc(c1)C(C)(C)C)C(C)(C)C)C#Cc1ccccc1 |
| Title of publication | Isoelectronic Pt(II) Complexes of Cyclometalating C^N^N Ligands with Phenyl/(Benzo)thiophenyl and Pyridyl/(Benzo)thiazolyl Moieties |
| Authors of publication | Krause, Maren; Friedel, Joshua; Buss, Stefan; Bruenkink, Dana; Berger, Annemarie; Strassert, Cristian Alejandro; Doltsinis, Nikos; Klein, Axel |
| Journal of publication | Dalton Transactions |
| Year of publication | 2022 |
| a | 13.1805 ± 0.0004 Å |
| b | 37.3146 ± 0.0019 Å |
| c | 6.7184 ± 0.0002 Å |
| α | 90° |
| β | 100.192 ± 0.003° |
| γ | 90° |
| Cell volume | 3252.1 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1542 |
| Residual factor for significantly intense reflections | 0.1016 |
| Weighted residual factors for significantly intense reflections | 0.2208 |
| Weighted residual factors for all reflections included in the refinement | 0.2434 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.124 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.56076 Å |
| Diffraction radiation type | AgKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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