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Information card for entry 7712588
Preview
| Coordinates | 7712588.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H22 Cl2 F6 N2 Ni O2 S2 |
|---|---|
| Calculated formula | C31 H22 Cl2 F6 N2 Ni O2 S2 |
| Title of publication | Spectroscopy, molecular structure, and electropolymerization of Ni(ii) and Cu(ii) complexes containing a thiophene-appending fluorinated Schiff base ligand |
| Authors of publication | Ahumada, Guillermo; Hamon, Paul; Roisnel, Thierry; Dorcet, Vincent; Fuentealba, Mauricio; Hernández, Loreto A.; Carrillo, David; Hamon, Jean-René; Manzur, Carolina |
| Journal of publication | Dalton Transactions |
| Year of publication | 2023 |
| Journal volume | 52 |
| Journal issue | 13 |
| Pages of publication | 4224 - 4236 |
| a | 18.4962 ± 0.0006 Å |
| b | 12.7149 ± 0.0006 Å |
| c | 14.25 ± 0.0006 Å |
| α | 90° |
| β | 105.31 ± 0.002° |
| γ | 90° |
| Cell volume | 3232.3 ± 0.2 Å3 |
| Cell temperature | 170 ± 2 K |
| Ambient diffraction temperature | 170 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0952 |
| Residual factor for significantly intense reflections | 0.0731 |
| Weighted residual factors for significantly intense reflections | 0.1845 |
| Weighted residual factors for all reflections included in the refinement | 0.2159 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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