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Information card for entry 7713975
Preview
| Coordinates | 7713975.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33 H45 Cl2 Co N3 O |
|---|---|
| Calculated formula | C33 H45 Cl2 Co N3 O |
| SMILES | [Co]12(Cl)(Cl)[n]3c(C(=[N]1c1c(cccc1C(C)C)C(C)C)C)cccc3C(=[N]2c1c(C(C)C)cccc1C(C)C)C.O |
| Title of publication | Field Induced Single Ion Magnet Behavior in CoII Complexes in Distorted Square Pyramidal Geometry |
| Authors of publication | Dey, Atanu; Ali, Junaid; MOORTHY, SHRUTI; Flores-Gonzalez, Jessica; Pointillart, Fabrice; Singh, Saurabh Kumar; Chandrasekhar, Vadapalli |
| Journal of publication | Dalton Transactions |
| Year of publication | 2023 |
| a | 8.7366 ± 0.0003 Å |
| b | 9.9079 ± 0.0003 Å |
| c | 20.9732 ± 0.0005 Å |
| α | 84.262 ± 0.002° |
| β | 88.202 ± 0.002° |
| γ | 65.478 ± 0.003° |
| Cell volume | 1643.34 ± 0.09 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0498 |
| Residual factor for significantly intense reflections | 0.0396 |
| Weighted residual factors for significantly intense reflections | 0.1033 |
| Weighted residual factors for all reflections included in the refinement | 0.1087 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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