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Information card for entry 7714695
Preview
| Coordinates | 7714695.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Galvinoxyl |
|---|---|
| Formula | C29 H41 O2 |
| Calculated formula | C29 H41 O2 |
| SMILES | O=C1C(=CC(=C[C]2C=C(C(=O)C(=C2)C(C)(C)C)C(C)(C)C)C=C1C(C)(C)C)C(C)(C)C |
| Title of publication | X-ray crystallographic analysis of the antiferromagnetic low-temperature phase of galvinoxyl: investigating magnetic duality in organic radicals. |
| Authors of publication | Suizu, Rie; Shuku, Yoshiaki; Robert, Vincent; Roseiro, Pablo; Ben Amor, Nadia; Khawar, Zain; Robertson, Neil; Awaga, Kunio |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 5 |
| Pages of publication | 1961 - 1965 |
| a | 10.5123 ± 0.0003 Å |
| b | 10.6991 ± 0.0003 Å |
| c | 22.8903 ± 0.0007 Å |
| α | 90° |
| β | 99.837 ± 0.003° |
| γ | 90° |
| Cell volume | 2536.67 ± 0.13 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123.15 K |
| Number of distinct elements | 3 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | I 1 2/a 1 |
| Hall space group symbol | -I 2ya |
| Residual factor for all reflections | 0.0516 |
| Residual factor for significantly intense reflections | 0.0463 |
| Weighted residual factors for significantly intense reflections | 0.1289 |
| Weighted residual factors for all reflections included in the refinement | 0.1333 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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