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Information card for entry 7714985
Preview
| Coordinates | 7714985.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C4 H14 Br4 N2 Sn |
|---|---|
| Calculated formula | C4 H14 Br4 N2 Sn |
| SMILES | [Sn](Br)(Br)(Br)(Br)[Br][Sn](Br)(Br)Br.[NH3+]CCCC[NH3+].[NH3+]CCCC[NH3+] |
| Title of publication | [NH<sub>3</sub>(CH<sub>2</sub>)<sub>4</sub>NH<sub>3</sub>]SnX<sub>4</sub> (X = Br, I): Dion-Jacobson type 2-D perovskites with short interlayer spacing. |
| Authors of publication | Vishwajith, Nagale S.; Sharma, Mridul Krishna; Jain, Isha; Vishnoi, Pratap |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 6 |
| Pages of publication | 2465 - 2470 |
| a | 11.6179 ± 0.0005 Å |
| b | 11.8042 ± 0.0005 Å |
| c | 19.4177 ± 0.0008 Å |
| α | 90° |
| β | 100.415 ± 0.002° |
| γ | 90° |
| Cell volume | 2619.07 ± 0.19 Å3 |
| Cell temperature | 273 ± 2 K |
| Ambient diffraction temperature | 273 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0956 |
| Residual factor for significantly intense reflections | 0.0432 |
| Weighted residual factors for significantly intense reflections | 0.0654 |
| Weighted residual factors for all reflections included in the refinement | 0.0777 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.97 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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