Information card for entry 7715274

Structure parameters

• Chemical name: Zn2(triaz)2(SSiPh3)2
• Formula: C52 H66 N6 S2 Si2 Zn2
• Calculated formula: C52 H66 N6 S2 Si2 Zn2
• Title of publication: Synthesis, characterisation and reactivity of a zinc triazenide for potential use in vapour deposition.
• Authors of publication: Samii, Rouzbeh; Barkas, Essi; Zanders, David; Fransson, Anton; Lahtinen, Manu; Kessler, Vadim; Tuononen, Heikki M.; Moilanen, Jani O.; O'Brien, Nathan J
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2024
• Journal volume: 53
• Journal issue: 13
• Pages of publication: 5911 - 5916
• a: 17.7677 ± 0.0002 Å
• b: 19.2739 ± 0.0002 Å
• c: 16.2548 ± 0.0002 Å
• α: 90°
• β: 106.723 ± 0.001°
• γ: 90°
• Cell volume: 5331.08 ± 0.11 ų
• Cell temperature: 120.01 ± 0.1 K
• Ambient diffraction temperature: 120.01 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0385
• Residual factor for significantly intense reflections: 0.0308
• Weighted residual factors for significantly intense reflections: 0.076
• Weighted residual factors for all reflections included in the refinement: 0.0803
• Goodness-of-fit parameter for all reflections included in the refinement: 1.03
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No