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Information card for entry 7715288
Preview
| Coordinates | 7715288.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C53 H50 Cu F6 N2 O P3 |
|---|---|
| Calculated formula | C53 H50 Cu F6 N2 O P3 |
| SMILES | [Cu]12([P](c3ccccc3)(c3c(Oc4c([P]1(c1ccccc1)c1ccccc1)cccc4)cccc3)c1ccccc1)[n]1c(c3[n]2cccc3)cccc1CCC(CC)CC.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Introducing sterically demanding substituents and π-π-interactions into [Cu(P^P)(N^N)]<sup>+</sup> complexes. |
| Authors of publication | Meyer, Marco; Prescimone, Alessandro; Constable, Edwin C.; Housecroft, Catherine E. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 12 |
| Pages of publication | 5453 - 5465 |
| a | 19.4572 ± 0.0003 Å |
| b | 24.5273 ± 0.0003 Å |
| c | 20.2217 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 9650.5 ± 0.3 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 7 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0643 |
| Residual factor for significantly intense reflections | 0.0574 |
| Weighted residual factors for significantly intense reflections | 0.1506 |
| Weighted residual factors for all reflections included in the refinement | 0.1643 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54186 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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