Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7715312
Preview
| Coordinates | 7715312.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H76 K2 O4 P2 Se2 |
|---|---|
| Calculated formula | C52 H76 K2 O4 P2 Se2 |
| Title of publication | Coordination chemistry of alkali metal dimesityl-thio- and dimesityl-selenophosphinites [(L)<sub>2</sub>A-EPMes<sub>2</sub>]<sub>2</sub> (A = Li, Na, K; E = S, Se; L = THF, THP) and [(18C6)K-SPMes<sub>2</sub>]. |
| Authors of publication | Dorow, Richard C. C.; Liebing, Phil; Görls, Helmar; Westerhausen, Matthias |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 12 |
| Pages of publication | 5711 - 5720 |
| a | 11.9075 ± 0.0003 Å |
| b | 16.8014 ± 0.0004 Å |
| c | 13.2648 ± 0.0002 Å |
| α | 90° |
| β | 92.043 ± 0.001° |
| γ | 90° |
| Cell volume | 2652.1 ± 0.1 Å3 |
| Cell temperature | 133 ± 2 K |
| Ambient diffraction temperature | 133 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.055 |
| Residual factor for significantly intense reflections | 0.0434 |
| Weighted residual factors for significantly intense reflections | 0.0923 |
| Weighted residual factors for all reflections included in the refinement | 0.0985 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7715312.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.