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Information card for entry 7715413
Preview
| Coordinates | 7715413.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C70 H77 O7 Pr Si3 |
|---|---|
| Calculated formula | C70 H77 O7 Pr Si3 |
| SMILES | [Pr](O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)([O]1CCCC1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)([O]1CCCC1)[O]1CCCC1.O1CCCC1 |
| Title of publication | A tetravalent praseodymium complex with field-induced slow magnetic relaxation. |
| Authors of publication | Xue, Tianjiao; Ding, You-Song; Zheng, Zhiping |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 13 |
| Pages of publication | 5779 - 5783 |
| a | 14.6493 ± 0.0005 Å |
| b | 16.2996 ± 0.0005 Å |
| c | 14.677 ± 0.0005 Å |
| α | 90° |
| β | 115.084 ± 0.0013° |
| γ | 90° |
| Cell volume | 3174.02 ± 0.18 Å3 |
| Cell temperature | 100.01 K |
| Ambient diffraction temperature | 100.01 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0533 |
| Residual factor for significantly intense reflections | 0.0447 |
| Weighted residual factors for significantly intense reflections | 0.1052 |
| Weighted residual factors for all reflections included in the refinement | 0.1111 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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