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Information card for entry 7716230
Preview
| Coordinates | 7716230.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H50 Ge N2 S Si4 |
|---|---|
| Calculated formula | C24 H50 Ge N2 S Si4 |
| SMILES | [Ge]1(=S)([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[N](=C(N1C(C)(C)C)c1ccccc1)C(C)(C)C |
| Title of publication | Activation of carbon disulfide by a hypersilyl germylene. |
| Authors of publication | Ajithkumar, V. S.; Khilari, Nripen; Ghanwat, Pratiksha B.; Venugopal, Geethu; Koley, Debasis; Sen, Sakya S. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 26 |
| Pages of publication | 10814 - 10818 |
| a | 21.115 ± 0.002 Å |
| b | 9.603 ± 0.0011 Å |
| c | 16.2157 ± 0.0019 Å |
| α | 90° |
| β | 93.596 ± 0.004° |
| γ | 90° |
| Cell volume | 3281.5 ± 0.6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 7 |
| Hermann-Mauguin space group symbol | P 1 c 1 |
| Hall space group symbol | P -2yc |
| Residual factor for all reflections | 0.0552 |
| Residual factor for significantly intense reflections | 0.0404 |
| Weighted residual factors for significantly intense reflections | 0.0869 |
| Weighted residual factors for all reflections included in the refinement | 0.0934 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7716230.html
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