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Information card for entry 7716987
Preview
| Coordinates | 7716987.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C80 H99 Cu12 N2 O114 P V2 W10 |
|---|---|
| Calculated formula | C80 H82.5024 Cu12 N2 O114 P V2.0004 W9.9996 |
| Title of publication | Encapsulation of the vanadium substituted Keggin polyoxometalates [α-PVW<sub>11</sub>O<sub>40</sub>]<sup>4-</sup> and [α-PV<sub>2</sub>W<sub>10</sub>O<sub>40</sub>]<sup>5-</sup> in HKUST-1. |
| Authors of publication | Orozco, José C; Shuaib, Damola T.; Swenson, LaSalle; Chen, Ying-Pin; Chen, Yu-Sheng; Khan, M. Ishaque |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 38 |
| Pages of publication | 15913 - 15919 |
| a | 26.2682 ± 0.0012 Å |
| b | 26.2682 ± 0.0012 Å |
| c | 26.2682 ± 0.0012 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 18125.5 ± 1.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 225 |
| Hermann-Mauguin space group symbol | F m -3 m |
| Hall space group symbol | -F 4 2 3 |
| Residual factor for all reflections | 0.0691 |
| Residual factor for significantly intense reflections | 0.0597 |
| Weighted residual factors for significantly intense reflections | 0.1709 |
| Weighted residual factors for all reflections included in the refinement | 0.1911 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.172 |
| Diffraction radiation wavelength | 0.41328 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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