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Information card for entry 7717180
Preview
| Coordinates | 7717180.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H16 N2 S |
|---|---|
| Calculated formula | C15 H16 N2 S |
| Title of publication | A chemically induced, room temperature, single source precursor to CuS (covellite) nanomaterials: synthesis and reactivity of [Cu(S<sub>2</sub>CNHBz)]<sub><i>n</i></sub>. |
| Authors of publication | Huang, Siqiao; Xu, Xiang; Sarker, Jagodish C.; Pugh, David; Hogarth, Graeme |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 42 |
| Pages of publication | 17140 - 17145 |
| a | 10.8357 ± 0.001 Å |
| b | 9.3683 ± 0.0007 Å |
| c | 26.594 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2699.6 ± 0.4 Å3 |
| Cell temperature | 295.6 ± 0.9 K |
| Ambient diffraction temperature | 295.6 ± 0.9 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0713 |
| Residual factor for significantly intense reflections | 0.0545 |
| Weighted residual factors for significantly intense reflections | 0.1211 |
| Weighted residual factors for all reflections included in the refinement | 0.13 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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