Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7717226
Preview
| Coordinates | 7717226.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C17 H34 F9 Gd N6 O7 |
|---|---|
| Calculated formula | C14 H26 F9 Gd N6 O6 |
| Title of publication | The first example of polymeric lanthanide <i>tetrakis</i>-trifluoroacetates in chemical solution deposition of up-converting NaGdF<sub>4</sub>:Yb,Er,Nd thin films. |
| Authors of publication | Burlakova, Maria; Blinnikova, Daria; Volkonovskiy, Gleb; Chai, Haoyang; Grebenyuk, Dimitry; Tsymbarenko, Dmitry |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 45 |
| Pages of publication | 18183 - 18192 |
| a | 18.294 ± 0.007 Å |
| b | 12.58 ± 0.005 Å |
| c | 24.686 ± 0.01 Å |
| α | 90° |
| β | 101.007 ± 0.007° |
| γ | 90° |
| Cell volume | 5577 ± 4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1081 |
| Residual factor for significantly intense reflections | 0.1027 |
| Weighted residual factors for significantly intense reflections | 0.2873 |
| Weighted residual factors for all reflections included in the refinement | 0.2919 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.131 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7717226.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.