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Information card for entry 7717565
Preview
| Coordinates | 7717565.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C82 H186 Ag21 Cu4 F24 N4 O4 P4 S20 |
|---|---|
| Calculated formula | C82 H174 Ag21 Cu4 F24 N4 O4 P4 S20 |
| Title of publication | Assembly of silver(I)-copper(I) bimetallic thiolate complexes assisted by phenylacetylene stabilizers. |
| Authors of publication | Jin, Jun-Ling; Zhang, Sheng-Fa; Fang, Jun-Jie; Shen, Yang-Lin; Xie, Yun-Peng; Lu, Xing |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2025 |
| Journal volume | 54 |
| Journal issue | 3 |
| Pages of publication | 1270 - 1275 |
| a | 14.7623 ± 0.0009 Å |
| b | 17.4036 ± 0.0012 Å |
| c | 17.9645 ± 0.0011 Å |
| α | 111.478 ± 0.002° |
| β | 110.109 ± 0.002° |
| γ | 98.581 ± 0.002° |
| Cell volume | 3828 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 9 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1101 |
| Residual factor for significantly intense reflections | 0.0625 |
| Weighted residual factors for significantly intense reflections | 0.1562 |
| Weighted residual factors for all reflections included in the refinement | 0.1809 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.011 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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