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Information card for entry 7717846
Preview
| Coordinates | 7717846.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | (η5-2,4-dimethylpentadienyl)(η5-2,4-dimethyl-1-oxapentadienyl) ruthenium |
|---|---|
| Formula | C13 H20 O Ru |
| Calculated formula | C13 H20 O Ru |
| Title of publication | Heteroleptic "open ruthenocene" for deposition of Ru films from the gas phase. |
| Authors of publication | Kultyshev, Roman; Harkness, Ian; Berry, Daniel B. G.; Jobson, Hoi; Marchbank, Huw; Eralp Erden, Tugce; Ashfield, Laura |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2025 |
| Journal volume | 54 |
| Journal issue | 6 |
| Pages of publication | 2261 - 2264 |
| a | 7.3396 ± 0.0002 Å |
| b | 16.866 ± 0.0004 Å |
| c | 10.2918 ± 0.0003 Å |
| α | 90° |
| β | 103.493 ± 0.002° |
| γ | 90° |
| Cell volume | 1238.85 ± 0.06 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0233 |
| Residual factor for significantly intense reflections | 0.02 |
| Weighted residual factors for significantly intense reflections | 0.0514 |
| Weighted residual factors for all reflections included in the refinement | 0.0529 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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