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Information card for entry 7718123
Preview
| Coordinates | 7718123.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | C29H48ON2Si2Sn |
|---|---|
| Formula | C29 H48 N2 O Si2 Sn |
| Calculated formula | C29 H48 N2 O Si2 Sn |
| Title of publication | Heteroleptic phenoxyimino tin(ii) bis(trimethylsilyl)amides for the synthesis of poly(diester-alt-ethers) from cyclohexene oxide and succinic anhydride |
| Authors of publication | Quek, Timothy; Chumsaeng, Phongnarin; Phomphrai, Khamphee |
| Journal of publication | Dalton Transactions |
| Year of publication | 2025 |
| Journal volume | 54 |
| Journal issue | 12 |
| Pages of publication | 5143 - 5152 |
| a | 10.5871 ± 0.0013 Å |
| b | 12.1261 ± 0.0014 Å |
| c | 13.7342 ± 0.0017 Å |
| α | 100.519 ± 0.003° |
| β | 103.382 ± 0.004° |
| γ | 105.443 ± 0.003° |
| Cell volume | 1596.4 ± 0.3 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0184 |
| Residual factor for significantly intense reflections | 0.0172 |
| Weighted residual factors for significantly intense reflections | 0.045 |
| Weighted residual factors for all reflections included in the refinement | 0.0455 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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