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Information card for entry 7718908
Preview
| Coordinates | 7718908.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H34 O3 Si2 |
|---|---|
| Calculated formula | C30 H34 O3 Si2 |
| Title of publication | Copper(II) complex with a redox-noninnocent Schiff base bearing a tetraphenyldisiloxane unit: synthesis, structure and catalytic oxidation of cyclohexane. |
| Authors of publication | Wittmann, Christopher; Palamarciuc, Oleg; Dascalu, Mihaela; Cazacu, Maria; Nesterov, Dmytro S.; Pombeiro, Armando J. L.; Rapta, Peter; Arion, Vladimir B. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2025 |
| Journal volume | 54 |
| Journal issue | 28 |
| Pages of publication | 10984 - 11005 |
| a | 19.379 ± 0.0013 Å |
| b | 18.5511 ± 0.0011 Å |
| c | 8.2443 ± 0.0006 Å |
| α | 90° |
| β | 113.254 ± 0.005° |
| γ | 90° |
| Cell volume | 2723.1 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0533 |
| Residual factor for significantly intense reflections | 0.0357 |
| Weighted residual factors for significantly intense reflections | 0.0696 |
| Weighted residual factors for all reflections included in the refinement | 0.071 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.955 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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