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Information card for entry 7719294
Preview
| Coordinates | 7719294.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ba Cl Cs2 S4 Ta |
|---|---|
| Calculated formula | Ba1.00003 Cl Cs1.99998 S4 Ta |
| Title of publication | Mixed-anion chalcogenide-halide semiconductors A<sub>2</sub>BaTaS<sub>4</sub>Cl (A = K, Rb, Cs) and K<sub>2</sub>BaNbS<sub>4</sub>Cl. |
| Authors of publication | Ie, Thomas S.; Nathan, Siddhartha S.; Rondinelli, James M.; Kanatzidis, Mercouri G. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2025 |
| Journal volume | 54 |
| Journal issue | 36 |
| Pages of publication | 13588 - 13597 |
| a | 12.7216 ± 0.0002 Å |
| b | 25.4311 ± 0.0004 Å |
| c | 14.1934 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4591.91 ± 0.14 Å3 |
| Cell temperature | 101 ± 2 K |
| Ambient diffraction temperature | 101 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 72 |
| Hermann-Mauguin space group symbol | I b a m |
| Hall space group symbol | -I 2 2c |
| Residual factor for all reflections | 0.0292 |
| Residual factor for significantly intense reflections | 0.0229 |
| Weighted residual factors for significantly intense reflections | 0.0585 |
| Weighted residual factors for all reflections included in the refinement | 0.0611 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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