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Information card for entry 7719308
Preview
| Coordinates | 7719308.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ba2.75 Pb1.16 Sb4.09 Se10 |
|---|---|
| Calculated formula | Ba2.75 Pb1.151 Sb4.099 Se10 |
| Title of publication | Semiconductor-to-semimetal transition on Te doping in a new semiconducting material Ba<sub>2.75</sub>Pb<sub>1.1</sub>Sb<sub>4.1</sub>Se<sub>10</sub>. |
| Authors of publication | Swati, ?; Jana, Subhendu; Barman, Sayani; Yadav, Sweta; Prakash, Jai |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2025 |
| Journal volume | 54 |
| Journal issue | 36 |
| Pages of publication | 13459 - 13471 |
| a | 9.173 ± 0.0007 Å |
| b | 8.5365 ± 0.0007 Å |
| c | 27.741 ± 0.003 Å |
| α | 90° |
| β | 99.797 ± 0.003° |
| γ | 90° |
| Cell volume | 2140.6 ± 0.3 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0507 |
| Residual factor for significantly intense reflections | 0.0385 |
| Weighted residual factors for significantly intense reflections | 0.0775 |
| Weighted residual factors for all reflections included in the refinement | 0.0817 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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