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Information card for entry 7720087
Preview
| Coordinates | 7720087.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H54 Bi2 Cl6 N10 Se4 |
|---|---|
| Calculated formula | C48 H54 Bi2 Cl6 N10 Se4 |
| Title of publication | Novel bismuth-selone molecular precursor based selective synthesis of Bi<sub>2</sub>Se<sub>3</sub> nanoplates and nanosheets: a promising electrocatalyst for hydrogen evolution in a neutral medium. |
| Authors of publication | Kulkarni, Atharva Yeshwant; Majumder, Dwaipayan; Nigam, Sandeep; Tripathi, Vaidehi S.; Wadawale, Amey P.; Bahadur, Jitendra; Pathak, Ankita; Karmakar, Gourab; Chauhan, Rohit Singh; Tyagi, Adish |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2026 |
| Journal volume | 55 |
| Journal issue | 8 |
| Pages of publication | 3570 - 3585 |
| a | 11.0388 ± 0.0002 Å |
| b | 11.9616 ± 0.0001 Å |
| c | 13.6884 ± 0.0002 Å |
| α | 64.115 ± 0.001° |
| β | 67.902 ± 0.001° |
| γ | 89.325 ± 0.001° |
| Cell volume | 1481.24 ± 0.04 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0489 |
| Residual factor for significantly intense reflections | 0.029 |
| Weighted residual factors for significantly intense reflections | 0.0704 |
| Weighted residual factors for all reflections included in the refinement | 0.0815 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7720087.html
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Users of the data should acknowledge the original authors of the
structural data.