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Information card for entry 7720915
Preview
| Coordinates | 7720915.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C43 H49 Cl2 Hf N Si |
|---|---|
| Calculated formula | C43 H49 Cl2 Hf N Si |
| Title of publication | Ph2Si-Bridged Constrained-Geometry Complexes of Hafnium and Titanium for Copolymerization of Ethylene and 1-Octene: An Experimental and Computational Comparison |
| Authors of publication | Kuchuk, Ekaterina; Giffin, Kaitie; Welle, Alexandre; Den Dauw, Katty; Fernandez, Alvaro; Cordier, Marie; Roisnel, Thierry; Carpentier, Jean-Francois; Kirillov, Evgueni |
| Journal of publication | Dalton Transactions |
| Year of publication | 2026 |
| a | 9.6214 ± 0.001 Å |
| b | 10.814 ± 0.0011 Å |
| c | 19.814 ± 0.002 Å |
| α | 78.369 ± 0.004° |
| β | 85.156 ± 0.004° |
| γ | 76.25 ± 0.003° |
| Cell volume | 1959.9 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0237 |
| Residual factor for significantly intense reflections | 0.0209 |
| Weighted residual factors for significantly intense reflections | 0.0453 |
| Weighted residual factors for all reflections included in the refinement | 0.0464 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.