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Information card for entry 8101852
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| Coordinates | 8101852.cif |
|---|---|
| External links | ChemSpider; PubChem |
| Common name | R,S-(-)-N-methylephedrine |
|---|---|
| Chemical name | R,S-(-)-N-methylephedrine |
| Formula | C11 H17 N O |
| Calculated formula | C11 H17 N O |
| SMILES | O[C@H]([C@H](N(C)C)C)c1ccccc1 |
| Title of publication | Crystal structure of R,S-(-)-N-methylephedrine, C~11~H~17~NO |
| Authors of publication | Staples, R. J.; Cho, E. |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2005 |
| Journal volume | 220 |
| Journal issue | 4 |
| Pages of publication | 543 - 544 |
| a | 8.0754 ± 0.0013 Å |
| b | 8.8987 ± 0.0014 Å |
| c | 14.571 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1047.1 ± 0.3 Å3 |
| Cell temperature | 193 ± 2 K |
| Ambient diffraction temperature | 193 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0409 |
| Residual factor for significantly intense reflections | 0.0381 |
| Weighted residual factors for significantly intense reflections | 0.1011 |
| Weighted residual factors for all reflections included in the refinement | 0.1051 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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