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Information card for entry 8105254
Preview
| Coordinates | 8105254.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H34 N2 S4 Sn |
|---|---|
| Calculated formula | C16 H34 N2 S4 Sn |
| SMILES | [Sn]1(SC(=S)N(C(C)C)C(C)C)(SC(=[S]1)N(C(C)C)C(C)C)(C)C |
| Title of publication | Crystal structure of dimethylbis(diisopropyldithiocarbamato-κ2 S,S′)tin(IV), C16H34N2S4Sn |
| Authors of publication | Haezam, Farah Natasha; Awang, Normah; Kamaludin, Nurul Farahana; Tiekink, Edward R.T. |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2020 |
| Journal volume | 235 |
| Journal issue | 3 |
| Pages of publication | 675 - 677 |
| a | 10.6234 ± 0.0001 Å |
| b | 16.0898 ± 0.0001 Å |
| c | 13.2405 ± 0.0001 Å |
| α | 90° |
| β | 92.853 ± 0.001° |
| γ | 90° |
| Cell volume | 2260.37 ± 0.03 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0206 |
| Residual factor for significantly intense reflections | 0.0197 |
| Weighted residual factors for significantly intense reflections | 0.0508 |
| Weighted residual factors for all reflections included in the refinement | 0.0513 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/8105254.html
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