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Information card for entry 8105412
Preview
| Coordinates | 8105412.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H24 N4 Ni O6 |
|---|---|
| Calculated formula | C30 H24 N4 Ni O6 |
| SMILES | [Ni]12345OC(=N[N]4=Cc4ccccc4[O]1CC[O]2c1ccccc1C=[N]5N=C(O3)c1c(O)cccc1)c1c(O)cccc1 |
| Title of publication | N′,N′′′-(((ethane-1,2-diylbis(oxy))bis(2,1-phenylene))bis(methaneylylidene))bis(2-hydroxybenzohydrazide)nickel(II), C30H24N4NiO6 |
| Authors of publication | Qiao, Hong-Tao; Zhao, San-Hu; Xi, Fu-Gui |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2020 |
| Journal volume | 235 |
| Journal issue | 5 |
| Pages of publication | 1171 - 1173 |
| a | 10.587 ± 0.0002 Å |
| b | 10.6944 ± 0.0002 Å |
| c | 13.683 ± 0.0003 Å |
| α | 100.7 ± 0.001° |
| β | 110.09 ± 0.001° |
| γ | 104.735 ± 0.001° |
| Cell volume | 1342.02 ± 0.05 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0619 |
| Residual factor for significantly intense reflections | 0.0388 |
| Weighted residual factors for significantly intense reflections | 0.0822 |
| Weighted residual factors for all reflections included in the refinement | 0.0925 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.031 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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