Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 48

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2300603 CIF
HKL
C26 H19 P SP -110.225; 12.336; 17.371
101.58; 91.21; 111.99
1979.1Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300604 CIF
HKL
C26 H19 P SP -110.223; 12.326; 17.357
101.55; 91.23; 112.05
1974.8Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300605 CIF
HKL
C26 H19 P SP -110.223; 12.326; 17.357
101.55; 91.23; 112.05
1974.8Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300606 CIF
HKL
C26 H19 P SP -110.223; 12.326; 17.357
101.55; 91.23; 112.05
1974.8Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300607 CIF
HKL
C26 H19 P SP -110.223; 12.326; 17.357
101.55; 91.23; 112.05
1974.8Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300608 CIF
HKL
C26 H19 P SP -110.213; 12.29; 17.335
101.62; 91.37; 112.09
1962.9Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300609 CIF
HKL
C26 H19 P SP -110.213; 12.29; 17.335
101.62; 91.37; 112.09
1962.9Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300610 CIF
HKL
C26 H19 P SP -110.213; 12.29; 17.335
101.62; 91.37; 112.09
1962.9Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497

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