# Search results of SQL query from the Crystallography Open Database
# Date and time performed: 2026-09-24T20:52:00+02:00
# Query:
# SELECT data.*
# FROM
#  data JOIN jaltnames
#  ON altname = journal
# WHERE
#  (status is null or status != 'retracted') and
#  (journal_id IN (SELECT DISTINCT(journal_id) FROM jaltnames WHERE altname LIKE 'Materials Research Society Symposia Proceedings') AND volume = 646 AND duplicateof IS NULL AND (status is NULL OR status != 'errors') AND (method is NULL OR method != 'theoretical'))
# ORDER BY file asc
file,a,siga,b,sigb,c,sigc,alpha,sigalpha,beta,sigbeta,gamma,siggamma,vol,sigvol,celltemp,sigcelltemp,diffrtemp,sigdiffrtemp,cellpressure,sigcellpressure,diffrpressure,sigdiffrpressure,thermalhist,pressurehist,compoundsource,nel,sg,sgHall,sgNumber,commonname,chemname,mineral,formula,calcformula,cellformula,Z,Zprime,acce_code,authors,title,journal,year,volume,issue,firstpage,lastpage,doi,method,radiation,wavelength,radType,radSymbol,Rall,Robs,Rref,wRall,wRobs,wRref,RFsqd,RI,gofall,gofobs,gofgt,gofref,duplicateof,optimal,status,flags,svnrevision,date,time,onhold
"1532195","3.2138","","3.2138","","7.8299","","90","","90","","90","","80.871","","","","","","","","","","","","","2","I 4/m m m","-I 4 2","139","","W Si2","","- Si2 W -","- Si2 W -","- Si4 W2 -","2","0.0625","","Tanaka, K.; Yamaguchi, M.; Nawata, K.; Inui, H.; Koiwa, M.","Refinement of crystallographic parameters in refractory metal disilicides","Materials Research Society Symposia Proceedings","2001","646","","N4.3.1","N4.3.5","","","","","","","","","","","","","","","","","","","","","","has coordinates","176429","2020-10-21","18:00:00",""
"1532198","4.5726","","4.5726","","6.3744","","90","","90","","120","","115.424","","","","","","","","","","","","","2","P 64 2 2","P 64 2 (0 0 2)","181","","V Si2","","- Si2 V -","- Si2 V -","- Si6 V3 -","3","0.25","","Tanaka, K.; Nawata, K.; Yamaguchi, M.; Inui, H.; Koiwa, M.","Refinement of crystallographic parameters in refractory metal disilicides","Materials Research Society Symposia Proceedings","2001","646","","N4.3.1","N4.3.5","","","","","","","","","","","","","","","","","","","","","","has coordinates","176429","2020-10-21","18:00:00",""
"1532201","4.4283","","4.4283","","6.368","","90","","90","","120","","108.145","","","","","","","","","","","","","2","P 64 2 2","P 64 2 (0 0 2)","181","","","","- Cr Si2 -","- Cr Si2 -","- Cr3 Si6 -","3","0.25","","Tanaka, K.; Nawata, K.; Koiwa, M.; Yamaguchi, M.; Inui, H.","Refinement of crystallographic parameters in refractory metal disilicides","Materials Research Society Symposia Proceedings","2001","646","","N4.3.1","N4.3.5","","","","","","","","","","","","","","","","","","","","","","has coordinates","211196","2020-10-21","18:00:00",""
"1532204","4.7974","","4.7974","","6.5923","","90","","90","","120","","131.395","","","","","","","","","","","","","2","P 62 2 2","P 62 2 (0 0 4)","180","","","","- Nb Si2 -","- Nb Si2 -","- Nb3 Si6 -","3","0.25","","Tanaka, K.; Nawata, K.; Koiwa, M.; Inui, H.; Yamaguchi, M.","Refinement of crystallographic parameters in refractory metal disilicides","Materials Research Society Symposia Proceedings","2001","646","","N4.3.1","N4.3.5","","","","","","","","","","","","","","","","","","","","","","has coordinates","211196","2020-10-21","18:00:00",""
"1532207","4.7839","","4.7839","","6.57","","90","","90","","120","","130.215","","","","","","","","","","","","","2","P 64 2 2","P 64 2 (0 0 2)","181","","Ta Si2","","- Si2 Ta -","- Si2 Ta -","- Si6 Ta3 -","3","0.25","","Tanaka, K.; Nawata, K.; Koiwa, M.; Inui, H.; Yamaguchi, M.","Refinement of crystallographic parameters in refractory metal disilicides","Materials Research Society Symposia Proceedings","2001","646","","N4.3.1","N4.3.5","","","","","","","","","","","","","","","","","","","","","","has coordinates","176429","2020-10-21","18:00:00",""
"1532210","8.268","","4.8002","","8.5521","","90","","90","","90","","339.416","","","","","","","","","","","","","2","F d d d :1","F 2 2 -1d","70","","Ti Si2","","- Si2 Ti -","- Si2 Ti -","- Si16 Ti8 -","8","0.25","","Tanaka, K.; Nawata, K.; Koiwa, M.; Yamaguchi, M.; Inui, H.","Refinement of crystallographic parameters in refractory metal disilicides","Materials Research Society Symposia Proceedings","2001","646","","N4.3.1","N4.3.5","","","","","","","","","","","","","","","","","","","","","","has coordinates","176429","2020-10-21","18:00:00",""