Crystallography Open Database

Result: there are 68 entries in the selection

Switch to the old layout of the page

Download all results as: list of COD numbers | list of CIF URLs | data in CSV format | archive of CIF files (ZIP)

Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 48

Blue left arrow Blue left arrow First | Blue left arrow Previous 20 | of 4 | Next 20 Blue right arrow | Last Blue right arrow Blue right arrow | Display 5 20 50 100 200 300 500 1000 entries per page

COD ID Blue up arrow Links Formula Up arrow Space group Up arrow Cell parameters Cell volume Up arrow Bibliography
2300571 CIF
HKL
Paper
C11 H10 O2 SP 21 21 215.9633; 9.0417; 18.4007
90; 90; 90
992.14Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar
An empirical correction for the influence of low-energy contamination
Journal of Applied Crystallography, 2015, 48, 1907-1913
2300572 CIF
HKL
Paper
C11 H10 O2 SP 21 21 215.9641; 9.0419; 18.4027
90; 90; 90
992.4Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar
An empirical correction for the influence of low-energy contamination
Journal of Applied Crystallography, 2015, 48, 1907-1913
2300573 CIF
HKL
Paper
C11 H10 O2 SP 21 21 215.9633; 9.0417; 18.4007
90; 90; 90
992.14Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar
An empirical correction for the influence of low-energy contamination
Journal of Applied Crystallography, 2015, 48, 1907-1913
2300574 CIF
Paper
C26 H19 P SP -110.215; 12.322; 17.351
101.57; 91.25; 112.02
1972.2Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar
An empirical correction for the influence of low-energy contamination
Journal of Applied Crystallography, 2015, 48, 1907-1913
2300575 CIF
Paper
C26 H19 P SP -110.215; 12.322; 17.351
101.57; 91.25; 112.02
1972.2Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar
An empirical correction for the influence of low-energy contamination
Journal of Applied Crystallography, 2015, 48, 1907-1913
2300588 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6769; 10.6769; 24.6539
90; 90; 120
2433.9Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300589 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6769; 10.6769; 24.6539
90; 90; 120
2433.9Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300590 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6769; 10.6769; 24.6539
90; 90; 120
2433.9Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300591 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6769; 10.6769; 24.6539
90; 90; 120
2433.9Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300592 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6712; 10.6712; 24.6546
90; 90; 120
2431.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300593 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6712; 10.6712; 24.6546
90; 90; 120
2431.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300594 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6712; 10.6712; 24.6546
90; 90; 120
2431.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300595 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6712; 10.6712; 24.6546
90; 90; 120
2431.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300596 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6434; 10.6434; 24.6108
90; 90; 120
2414.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300597 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6434; 10.6434; 24.6108
90; 90; 120
2414.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300598 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6434; 10.6434; 24.6108
90; 90; 120
2414.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300599 CIF
HKL
C96 H126 Mg3 N36R -3 :H10.6434; 10.6434; 24.6108
90; 90; 120
2414.4Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300600 CIF
HKL
C26 H19 P SP -110.225; 12.336; 17.371
101.58; 91.21; 111.99
1979.1Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300601 CIF
HKL
C26 H19 P SP -110.225; 12.336; 17.371
101.58; 91.21; 111.99
1979.1Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497
2300602 CIF
HKL
C26 H19 P SP -110.225; 12.336; 17.371
101.58; 91.21; 111.99
1979.1Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar
Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering
Journal of Applied Crystallography, 2015, 48, 1485-1497

Blue left arrow Blue left arrow First | Blue left arrow Previous 20 | of 4 | Next 20 Blue right arrow | Last Blue right arrow Blue right arrow | Display 5 20 50 100 200 300 500 1000 entries per page

Back to the search form
Your own data is not in the COD? Deposit it, thanks!