Crystallography Open Database
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 48
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 2300485 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.462; 16.147; 3.988 90; 90; 90 | 416.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300486 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.447; 16.121; 3.982 90; 90; 90 | 413.9 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300487 | CIF HKL Paper | Br0.09 Cl0.91 Cu6 O8 Pb | F m -3 m | 9.216; 9.216; 9.216 90; 90; 90 | 782.8 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300488 | CIF Paper | Br0.1 Cl0.9 Cu6 O8 Pb | F m -3 m | 9.2164; 9.2164; 9.2164 90; 90; 90 | 782.86 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300489 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.439; 10.559; 13.807 90; 90; 90 | 1230.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300490 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.442; 10.569; 13.816 90; 90; 90 | 1232.7 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300491 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.394; 4.374; 11.995 90; 90; 90 | 178.07 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300492 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.398; 4.377; 12.003 90; 90; 90 | 178.52 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300493 | CIF HKL Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.601; 8.377; 17.201 90; 97.35; 90 | 1372.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300494 | CIF Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.599; 8.378; 17.194 90; 97.32; 90 | 1371.5 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300495 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.568; 9.504; 21.378 90; 102.95; 90 | 3676.6 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300496 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.588; 9.518; 21.403 90; 102.95; 90 | 3690.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300497 | CIF HKL | Bi1.09 Ge2.37 Te4 | F m -3 m | 6.055; 6.055; 6.055 90; 90; 90 | 221.99 | Urban, Philipp; Simonov, Arkadiy; Weber, Thomas; Oeckler, Oliver Real structure of Ge4Bi2Te7: refinement on diffuse scattering data with the 3D-ΔPDF method Journal of Applied Crystallography, 2015, 48, 200 |
| 2300498 | CIF Paper | K0.5 Na0.5 Nb O3 | R 3 m :H | 5.6085; 5.6085; 6.9183 90; 90; 120 | 188.46 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
| 2300499 | CIF Paper | K0.5 Na0.5 Nb O3 | A m m 2 | 3.9443; 5.6425; 5.6763 90; 90; 90 | 126.33 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
| 2300501 | CIF HKL | C7 H10 N2 O2 | C 1 2/c 1 | 17.822; 4.85; 19.783 90; 102.37; 90 | 1670.3 | Graiff, Claudia; Pontiroli, Daniele; Bergamonti, Laura; Cavallari, Chiara; Lottici, Pier Paolo; Predieri, Giovanni Structural investigation of <i>N</i>,<i>N</i>'-methylenebisacrylamide <i>via</i> X-ray diffraction assisted by crystal structure prediction Journal of Applied Crystallography, 2015, 48, 550-557 |
| 2300502 | CIF | C13 H15 Co N2 O7 | P 1 21/c 1 | 12.6105; 7.6858; 15.9256 90; 106.541; 90 | 1479.66 | Cox, Jordan M.; Walton, Ian M.; Benson, Cassidy A.; Chen, Yu-Sheng; Benedict, Jason B. A versatile environmental control cell for <i>in situ</i> guest exchange single-crystal diffraction Journal of Applied Crystallography, 2015, 48, 578-581 |
| 2300503 | CIF HKL | C42 H80 Br2 N2 O3 | C 1 2/c 1 | 54.695; 9.8891; 16.877 90; 92.628; 90 | 9118.9 | Chen, Qibin; Yao, Junyao; Hu, Xin; Shen, Jincheng; Sheng, Yujie; Liu, Honglai Monolayer effect of a gemini surfactant with a rigid biphenyl spacer on its self-crystallization at the air/liquid interface Journal of Applied Crystallography, 2015, 48 |
| 2300504 | CIF HKL | Mg Mo O4 | C 1 2/m 1 | 10.157; 9.246; 7.03 90; 105.9; 90 | 634.94 | Gemmi, Mauro; La Placa, Maria G. I.; Galanis, Athanassios S.; Rauch, Edgar F.; Nicolopoulos, Stavros Fast electron diffraction tomography Journal of Applied Crystallography, 2015, 48 |
| 2300505 | CIF HKL | C28 H26 N2 O4 | P 1 21/n 1 | 5.9038; 10.7455; 19.4895 90; 90.263; 90 | 1236.39 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300506 | CIF HKL | C24 H22 Cl6 N2 O4 | P 1 21/n 1 | 6.8524; 11.9655; 17.3274 90; 99.678; 90 | 1400.5 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300507 | CIF HKL | C26 H28 N2 O5 | P 1 21/c 1 | 13.2363; 11.765; 17.6353 90; 103.281; 90 | 2672.8 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300508 | CIF HKL | C32 H28 N4 O4 | P 1 2/c 1 | 12.8209; 7.0395; 14.7623 90; 96.82; 90 | 1322.91 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300509 | CIF HKL | C6 H9 N3 O6 | P n a 21 | 9.0136; 21.5; 4.7005 90; 90; 90 | 910.9 | Prasad, A. Aditya; Meenakshisundaram, S. P. Hydrogen-bonded supramolecular architecture in nonlinear optical ammonium 2,4-dinitrophenolate hydrate Journal of Applied Crystallography, 2015, 48 |
| 2300513 | CIF HKL | C32 H39 N O2 | P 1 21/c 1 | 16.589; 10.9575; 16.6795 90; 113.623; 90 | 2777.8 | Sharma, Ranjana; Prasher, Dixit; Tiwari, R. K. Crystal structure analysis of ebastine [4-(4-benzhydryloxy-1-piperidyl)-1-(4-<i>tert</i>-butylphenyl) butan-1-one]: an oral histamine antagonist Journal of Applied Crystallography, 2015, 48 |
| 2300556 | CIF | Cl H Ni O | R -3 m :H | 3.26061; 3.26061; 17.00619 90; 90; 120 | 156.58 | Bette, Sebastian; Dinnebier, Robert E.; Freyer, Daniela Structure solution and refinement of stacking-faulted NiCl(OH) Journal of Applied Crystallography, 2015, 48 |
| 2300557 | CIF HKL | C12 H22 O11 | P 1 21 1 | 7.763; 8.7109; 10.8701 90; 102.937; 90 | 716.407 | Dmitrienko, Artem O.; Bushmarinov, Ivan S. Reliable structural data from Rietveld refinements <i>via</i> restraint consistency Journal of Applied Crystallography, 2015, 48 |
| 2300558 | CIF | Ni Si | P n m a | 5.1731; 3.3381; 5.6049 90; 90; 90 | 96.79 | Lord, Oliver T.; Thomson, Andrew R.; Wann, Elizabeth T. H.; Wood, Ian G.; Dobson, David P.; Vocadlo, Lidunka The equation of state of the <i>Pmmn</i> phase of NiSi Journal of Applied Crystallography, 2015, 48, 1914-1920 |
| 2300559 | CIF HKL Paper | C28 H18 N2 | C 1 2/c 1 | 13.5559; 12.2134; 12.6643 90; 118.834; 90 | 1836.8 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300560 | CIF HKL Paper | C28 H18 N2 | C 1 2/c 1 | 13.5537; 12.2132; 12.6619 90; 118.836; 90 | 1836.1 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300561 | CIF HKL Paper | C28 H18 N2 | C 1 2/c 1 | 13.5559; 12.2134; 12.6643 90; 118.834; 90 | 1836.8 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300562 | CIF HKL Paper | C12 H4 N4 | C 1 2/c 1 | 8.896; 6.913; 16.439 90; 98.29; 90 | 1000.4 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300563 | CIF HKL Paper | C12 H4 N4 | C 1 2/c 1 | 8.884; 6.9036; 16.421 90; 98.241; 90 | 996.7 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300564 | CIF HKL Paper | C12 H4 N4 | C 1 2/c 1 | 8.896; 6.913; 16.439 90; 98.29; 90 | 1000.4 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300565 | CIF HKL Paper | C18 H17 Cu O6 | C 1 2/c 1 | 9.7935; 19.0055; 18.2997 90; 94.7996; 90 | 3394.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300566 | CIF HKL Paper | C18 H17 Cu O6 | C 1 2/c 1 | 9.7936; 18.9973; 18.2982 90; 94.84; 90 | 3392.3 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300567 | CIF HKL Paper | C18 H17 Cu O6 | C 1 2/c 1 | 9.7935; 19.0055; 18.2997 90; 94.7996; 90 | 3394.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300568 | CIF HKL Paper | C34 H26 Mg N4 O4 | P 1 21/n 1 | 11.3068; 14.9595; 16.7252 90; 93.05; 90 | 2825 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300569 | CIF HKL Paper | C34 H26 Mg N4 O4 | P 1 21/n 1 | 11.3182; 14.9745; 16.744 90; 93.044; 90 | 2833.8 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300570 | CIF HKL Paper | C34 H26 Mg N4 O4 | P 1 21/n 1 | 11.3068; 14.9595; 16.7252 90; 93.05; 90 | 2825 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300571 | CIF HKL Paper | C11 H10 O2 S | P 21 21 21 | 5.9633; 9.0417; 18.4007 90; 90; 90 | 992.14 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300572 | CIF HKL Paper | C11 H10 O2 S | P 21 21 21 | 5.9641; 9.0419; 18.4027 90; 90; 90 | 992.4 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300573 | CIF HKL Paper | C11 H10 O2 S | P 21 21 21 | 5.9633; 9.0417; 18.4007 90; 90; 90 | 992.14 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300574 | CIF Paper | C26 H19 P S | P -1 | 10.215; 12.322; 17.351 101.57; 91.25; 112.02 | 1972.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300575 | CIF Paper | C26 H19 P S | P -1 | 10.215; 12.322; 17.351 101.57; 91.25; 112.02 | 1972.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300588 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300589 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300590 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300591 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300592 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6712; 10.6712; 24.6546 90; 90; 120 | 2431.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
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