Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 53

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2300668 CIF
HKL
O24 Si12P n m a20.022; 19.899; 13.383
90; 90; 90
5332Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong
<i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction
Journal of Applied Crystallography, 2020, 53, 1217-1224
2300669 CIF
HKL
O24 Si12P n m a20.022; 19.899; 13.383
90; 90; 90
5332Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong
<i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction
Journal of Applied Crystallography, 2020, 53, 1217-1224
2300670 CIF
HKL
C42 H28C m c e26.7958; 7.1586; 14.1598
90; 90; 90
2716.1Krause, Lennard; Tolborg, Kasper; Grønbech, Thomas Bjørn Egede; Sugimoto, Kunihisa; Iversen, Bo Brummerstedt; Overgaard, Jacob
Accurate high-resolution single-crystal diffraction data from a Pilatus3 X CdTe detector
Journal of Applied Crystallography, 2020, 53, 635
2300671 CIF
HKL
C40 H29 Cl Cu N6 O14P -110.6656; 12.4599; 14.7567
98.635; 101.65; 97.962
1869.79Pinto, Camila B.; Dos Santos, Leonardo H. R.; Rodrigues, Bernardo L.
On the Hirshfeld surface for copper(II) atoms in different coordination environments
Journal of Applied Crystallography, 2020, 53, 1321-1333
2300672 CIF
HKL
C6 D12 N4I -4 3 m7.0195; 7.0195; 7.0195
90; 90; 90
345.874McMonagle, Charles J.; Allan, David R.; Warren, Mark R.; Kamenev, Konstantin V.; Turner, Gemma F.; Moggach, Stephen A.
High-pressure sapphire capillary cell for synchrotron single-crystal X-ray diffraction measurements to 1500 bar
Journal of Applied Crystallography, 2020, 53, 1519-1523

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