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Information card for entry 1100719
Preview
Coordinates | 1100719.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | AMA232 |
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Formula | C67 H84 B2 Cu2 N8 O7 |
Calculated formula | C67 H84 B2 Cu2 N8 O7 |
SMILES | [Cu]1234OC(=O)O[Cu]567[N]8(CCC[N]2(CC[N]1(CCC[N]5(CC8)CC[NH2]7)CC[NH2]3)CC[NH2]4)CC[NH2]6.O.O.O.O.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Concentration of Carbon Dioxide by Electrochemically Modulated Complexation with a Binuclear Copper Complex |
Authors of publication | Aaron M. Appel; Rachel Newell; Daniel L. DuBois; M. Rakowski DuBois |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 3046 - 3056 |
a | 13.3916 ± 0.0005 Å |
b | 13.4574 ± 0.0005 Å |
c | 20.1343 ± 0.0007 Å |
α | 73.226 ± 0.001° |
β | 86.07 ± 0.001° |
γ | 64.368 ± 0.001° |
Cell volume | 3125.6 ± 0.2 Å3 |
Cell temperature | 141 ± 2 K |
Ambient diffraction temperature | 141 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1163 |
Residual factor for significantly intense reflections | 0.0663 |
Weighted residual factors for significantly intense reflections | 0.1515 |
Weighted residual factors for all reflections included in the refinement | 0.1763 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.985 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1100719.html
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