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Information card for entry 1100737
Preview
Coordinates | 1100737.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | Cl4 H92 K4 Na6 Nd O162 P4 W34 |
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Calculated formula | Cl4 K4 Na4 Nd O162 P4 W34 |
SMILES | [Nd]123456(O[W]789(=O)[O]=P%10%11[O]%12[W]%13%14(=O)(O8)O[W]8%15%16(=O)[O]%17[W]%18%19(=O)(O%15)O[W]%15%20%21(=O)[O]%22[W]%23(=O)(O[W]%24%25(=O)(O3)[O]3[W](=O)(O%24)(O8)(O[W]8%24(=O)([O]%26([W](=O)(O%18)(O%20)(O8)O[W]%26(=O)(O%25)(O%23)O%24)P%17%22=3)O%16)O7)(O%15)O[W]37(=O)(O1)[O]%10[W]1(=O)(O[W]%12(=O)(O%13)(O%19)O[W]8%10(=O)([O]%12%11[W](=O)(O9)(O%14)(O8)O[W]%12(=O)(O2)(O7)O%10)O1)(O%21)O3)O[W]123(=O)[O]=P78[O]9[W]%10%11(=O)(O1)O[W]1%12%13(=O)[O]%14[W]%15%16(=O)(O%12)O[W]%12%17%18(=O)[O]%19[W]%20(=O)(O[W]%21%22(=O)(O4)[O]4[W](=O)(O%21)(O1)(O[W]1%21(=O)([O]%23([W](=O)(O%15)(O%17)(O1)O[W]%23(=O)(O%22)(O%20)O%21)P%14%19=4)O%13)O2)(O%12)O[W]12(=O)(O5)[O]7[W]4(=O)(O[W]9(=O)(O%10)(O%16)O[W]57(=O)([O]98[W](=O)(O3)(O%11)(O5)O[W]9(=O)(O6)(O1)O7)O4)(O%18)O2.[K+].[K+].[Cl-].[Cl-].[Na+].[Na+].[K+].[K+].[Cl-].[Cl-].[Na+].[Na+].O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O |
Title of publication | Influence of Steric and Electronic Properties of the Defect Site, Lanthanide Ionic Radii, and Solution Conditions on the Composition of Lanthanide(III) α1-P2W17O6110-Polyoxometalates |
Authors of publication | Cheng Zhang; Robertha C. Howell; Qun-Hui Luo; Heidi L. Fieselmann; Louis J. Todaro; Lynn C. Francesconi |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 3569 - 3578 |
a | 41.072 ± 0.008 Å |
b | 16.152 ± 0.003 Å |
c | 24.933 ± 0.005 Å |
α | 90° |
β | 104.63 ± 0.03° |
γ | 90° |
Cell volume | 16004 ± 6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1846 |
Residual factor for significantly intense reflections | 0.1221 |
Weighted residual factors for significantly intense reflections | 0.2982 |
Weighted residual factors for all reflections included in the refinement | 0.3469 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1100737.html
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