Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1502587
Preview
Coordinates | 1502587.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C61 H64 F12 N4 O12 P2 |
---|---|
Calculated formula | C61 H64 F12 N4 O12 P2 |
SMILES | [P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].O1CCOCCOc2c3OCCOCCOCCOc4c(OCC1)cc(COC(=O)c1nc(C(=O)OCc(cc3)c2)ccc1)cc4.[n+]1(ccc(cc1)/C=C/c1cc[n+](cc1)Cc1ccccc1)Cc1ccccc1.N#CC |
Title of publication | [2]Pseudorotaxanes based on the recognition of cryptands to vinylogous viologens. |
Authors of publication | Yan, Xuzhou; Wei, Peifa; Zhang, Mingming; Chi, Xiaodong; Liu, Jiyong; Huang, Feihe |
Journal of publication | Organic letters |
Year of publication | 2011 |
Journal volume | 13 |
Journal issue | 24 |
Pages of publication | 6370 - 6373 |
a | 10.6512 ± 0.0004 Å |
b | 16.4297 ± 0.0006 Å |
c | 17.8203 ± 0.0007 Å |
α | 76.573 ± 0.003° |
β | 79.336 ± 0.003° |
γ | 85.849 ± 0.003° |
Cell volume | 2979.4 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0732 |
Residual factor for significantly intense reflections | 0.0481 |
Weighted residual factors for significantly intense reflections | 0.1076 |
Weighted residual factors for all reflections included in the refinement | 0.123 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1502587.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.