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Information card for entry 1502694
Preview
Coordinates | 1502694.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C34 H35 Cl9 N2 O14 Ru3 |
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Calculated formula | C34 H35 Cl9 N2 O14 Ru3 |
SMILES | c1cc2c(cccc2)c[n]1[Ru]1234[O]5[Ru]6(C#[O])([O]=C(C)O1)(OC(C)=[O]2)[O]=C(C)O[Ru]5([n]1ccc2c(c1)cccc2)([O]=C(C)O6)([O]=C(C)O3)OC(C)=[O]4.C(Cl)(Cl)Cl.C(Cl)(Cl)Cl.C(Cl)(Cl)Cl |
Title of publication | Electronic structural effects in self-exchange reactions. |
Authors of publication | Goeltz, John C.; Benson, Eric E.; Kubiak, Clifford P. |
Journal of publication | The journal of physical chemistry. B |
Year of publication | 2010 |
Journal volume | 114 |
Journal issue | 45 |
Pages of publication | 14729 - 14734 |
a | 14.657 ± 0.006 Å |
b | 18.3 ± 0.008 Å |
c | 17.958 ± 0.008 Å |
α | 90° |
β | 95.826 ± 0.006° |
γ | 90° |
Cell volume | 4792 ± 4 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0529 |
Residual factor for significantly intense reflections | 0.0388 |
Weighted residual factors for significantly intense reflections | 0.0866 |
Weighted residual factors for all reflections included in the refinement | 0.0959 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1502694.html
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