Information card for entry 1503177
| Common name |
N-Cyclohexanoyldithieno[3,2-b:2',3'-d]pyrrole |
| Chemical name |
N-Cyclohexanoyldithieno[3,2-b:2',3'-d]pyrrole |
| Formula |
C15 H15 N O S2 |
| Calculated formula |
C15 H15 N O S2 |
| SMILES |
s1ccc2n(c3ccsc3c12)C(=O)C1CCCCC1 |
| Title of publication |
N-acyldithieno[3,2-b:2',3'-d]pyrroles: second generation dithieno[3,2-b:2',3'-d]pyrrole building blocks with stabilized energy levels. |
| Authors of publication |
Evenson, Sean J.; Rasmussen, Seth C. |
| Journal of publication |
Organic letters |
| Year of publication |
2010 |
| Journal volume |
12 |
| Journal issue |
18 |
| Pages of publication |
4054 - 4057 |
| a |
8.321 ± 0.003 Å |
| b |
8.994 ± 0.003 Å |
| c |
9.073 ± 0.003 Å |
| α |
95.102 ± 0.005° |
| β |
93.093 ± 0.005° |
| γ |
92.926 ± 0.005° |
| Cell volume |
674.3 ± 0.4 Å3 |
| Cell temperature |
273 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0491 |
| Residual factor for significantly intense reflections |
0.0451 |
| Weighted residual factors for significantly intense reflections |
0.134 |
| Weighted residual factors for all reflections included in the refinement |
0.1392 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.067 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1503177.html