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Information card for entry 1503299
Preview
Coordinates | 1503299.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C27 H28 O3 Si |
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Calculated formula | C27 H28 O3 Si |
SMILES | c1(ccccc1)[Si](c1ccccc1)(c1ccccc1)[C@H]1COC(=O)[C@@]21[C@@](CCC2)(C)O.c1(ccccc1)[Si](c1ccccc1)(c1ccccc1)[C@@H]1COC(=O)[C@]21[C@](CCC2)(C)O |
Title of publication | SmI~2~-mediated radical cyclizations directed by a C-Si bond |
Authors of publication | Harb, Hassan Y.; Collins, Karl D.; Garcia Altur, Jose V.; Bowker, Sue; Campbell, Leonie; Procter, David J. |
Journal of publication | Organic Letters |
Year of publication | 2010 |
Journal volume | 12 |
Journal issue | 23 |
Pages of publication | 5446 - 5449 |
a | 19.059 ± 0.003 Å |
b | 10.62 ± 0.002 Å |
c | 11.276 ± 0.002 Å |
α | 90° |
β | 102.039 ± 0.004° |
γ | 90° |
Cell volume | 2232.1 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0586 |
Residual factor for significantly intense reflections | 0.0432 |
Weighted residual factors for significantly intense reflections | 0.1014 |
Weighted residual factors for all reflections included in the refinement | 0.1072 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1503299.html
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