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Information card for entry 1504547
Preview
Coordinates | 1504547.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H10 F32 N2 O4 |
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Calculated formula | C40 H10 F32 N2 O4 |
SMILES | N1(CC(F)(F)C(F)(F)C(F)(F)F)C(=O)c2ccc3c4c(c(cc(C1=O)c24)C(C(C(C(F)(F)F)(F)F)(F)F)(F)F)c1c2c3c(cc3C(=O)N(C(=O)c(cc1)c23)CC(C(C(F)(F)F)(F)F)(F)F)C(C(C(C(F)(F)F)(F)F)(F)F)(F)F |
Title of publication | Air-stable n-type semiconductor: core-perfluoroalkylated perylene bisimides. |
Authors of publication | Li, Yan; Tan, Lin; Wang, Zhaohui; Qian, Hualei; Shi, Yubai; Hu, Wenping |
Journal of publication | Organic letters |
Year of publication | 2008 |
Journal volume | 10 |
Journal issue | 4 |
Pages of publication | 529 - 532 |
a | 10.57 ± 0.003 Å |
b | 12.885 ± 0.003 Å |
c | 16.682 ± 0.004 Å |
α | 66.858 ± 0.01° |
β | 76.524 ± 0.015° |
γ | 84.62 ± 0.017° |
Cell volume | 2031.7 ± 0.9 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0917 |
Residual factor for significantly intense reflections | 0.0548 |
Weighted residual factors for significantly intense reflections | 0.1238 |
Weighted residual factors for all reflections included in the refinement | 0.1443 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1504547.html
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Users of the data should acknowledge the original authors of the
structural data.