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Information card for entry 1505142
Preview
Coordinates | 1505142.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H22 O6 |
---|---|
Calculated formula | C22 H22 O6 |
SMILES | COc1ccc(cc1)COC([C@@H]([C@H](C(OCc1ccc(cc1)OC)=O)/C=C/[C@@H]([C@@H](C(OCc1ccc(cc1)OC)=O)/C=C/[CH]C(OCc1ccc(cc1)OC)=O)C(OCc1ccc(cc1)OC)=O)/C=C/[C@@H]([C@@H](C(OCc1ccc(cc1)OC)=O)/C=C/[CH]C(OCc1ccc(cc1)OC)=O)C(OCc1ccc(cc1)OC)=O)=O |
Title of publication | Reaction Mechanism Based on X-ray Crystal Structure Analysis during the Solid-State Polymerization of Muconic Esters |
Authors of publication | Furukawa, Daisuke; Matsumoto, Akikazu |
Journal of publication | Macromolecules |
Year of publication | 2007 |
Journal volume | 40 |
Journal issue | 17 |
Pages of publication | 6048 |
a | 34.714 ± 0.004 Å |
b | 5.7047 ± 0.0005 Å |
c | 9.4233 ± 0.0009 Å |
α | 90° |
β | 98.352 ± 0.005° |
γ | 90° |
Cell volume | 1846.3 ± 0.3 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 3 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0448 |
Residual factor for significantly intense reflections | 0.0401 |
Weighted residual factors for significantly intense reflections | 0.1066 |
Weighted residual factors for all reflections included in the refinement | 0.1094 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.093 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1505142.html
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