Information card for entry 1505215

Structure parameters

• Common name: Alexf002
• Chemical name: Alex002
• Formula: C40 H42 N2 O4
• Calculated formula: C40 H42 N2 O4
• SMILES: CCCCCCCCN1C(=O)c2ccc3c4c2c(C1=O)ccc4c1c2c3ccc3c2c(cc1)C(=O)N(C3=O)CCCCCCCC
• Title of publication: Perylenediimide nanowires and their use in fabricating field-effect transistors and complementary inverters.
• Authors of publication: Briseno, Alejandro L.; Mannsfeld, Stefan C. B.; Reese, Colin; Hancock, Jessica M.; Xiong, Yujie; Jenekhe, Samson A.; Bao, Zhenan; Xia, Younan
• Journal of publication: Nano letters
• Year of publication: 2007
• Journal volume: 7
• Journal issue: 9
• Pages of publication: 2847 - 2853
• a: 4.6757 ± 0.0009 Å
• b: 8.502 ± 0.0016 Å
• c: 19.718 ± 0.005 Å
• α: 85.993 ± 0.009°
• β: 88.432 ± 0.008°
• γ: 82.788 ± 0.013°
• Cell volume: 775.6 ± 0.3 ų
• Cell temperature: 130 ± 2 K
• Ambient diffraction temperature: 130 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.3145
• Residual factor for significantly intense reflections: 0.091
• Weighted residual factors for significantly intense reflections: 0.1549
• Weighted residual factors for all reflections included in the refinement: 0.2247
• Goodness-of-fit parameter for all reflections included in the refinement: 0.93
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No