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Information card for entry 1507564
Preview
Coordinates | 1507564.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H60 N6 O9 |
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Calculated formula | C53 H60 N6 O9 |
SMILES | C1CC[C@@]23C[C@H]4C(C5=N(c6c7C=CC(Oc7ccc6[C@]65[C@@H]([C@]4(C(=O)N12)NC3=O)N1[C@]23[C@@H](C[C@@]4(CCCN4C3=O)C1=O)C(c1[nH]c3c4C=CC(Oc4ccc3c1[C@H]62)(C)C)(C)C)(C)C)=O)(C)C.O.OC |
Title of publication | Waikialoid A Suppresses Hyphal Morphogenesis and Inhibits Biofilm Development in Pathogenic Candida albicans. |
Authors of publication | Wang, Xiaoru; You, Jianlan; King, Jarrod B.; Powell, Douglas R.; Cichewicz, Robert H. |
Journal of publication | Journal of natural products |
Year of publication | 2012 |
Journal volume | 75 |
Journal issue | 4 |
Pages of publication | 707 - 715 |
a | 10.6276 ± 0.0004 Å |
b | 17.6706 ± 0.0006 Å |
c | 12.8917 ± 0.0004 Å |
α | 90° |
β | 104.187 ± 0.002° |
γ | 90° |
Cell volume | 2347.17 ± 0.14 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0316 |
Residual factor for significantly intense reflections | 0.0316 |
Weighted residual factors for significantly intense reflections | 0.0845 |
Weighted residual factors for all reflections included in the refinement | 0.0845 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.005 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1507564.html
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Users of the data should acknowledge the original authors of the
structural data.