Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1507746
Preview
Coordinates | 1507746.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H42 O4 S3 Si |
---|---|
Calculated formula | C28 H42 O4 S3 Si |
SMILES | S(=O)(=O)([C@]12C=CC[C@@H](O[Si](C(C)(C)C)(C)C)[C@@H]2C2(SCCCS2)C[C@H]1[C@H](C(=O)C)C)c1ccccc1.S(=O)(=O)([C@@]12C=CC[C@H](O[Si](C(C)(C)C)(C)C)[C@H]2C2(SCCCS2)C[C@@H]1[C@@H](C(=O)C)C)c1ccccc1 |
Title of publication | Intramolecular Methylation of an Allyl Sulfone via Lithium Alkoxyaluminate; Application to the Enantioselective Synthesis of the CD Ring of Vitamin D(3). |
Authors of publication | Sikervar, Vikas; Fuchs, Philip L. |
Journal of publication | Organic letters |
Year of publication | 2012 |
Journal volume | 14 |
Journal issue | 11 |
Pages of publication | 2922 - 2924 |
a | 10.5036 ± 0.0004 Å |
b | 23.9728 ± 0.0011 Å |
c | 12.1982 ± 0.0007 Å |
α | 90° |
β | 106.159 ± 0.003° |
γ | 90° |
Cell volume | 2950.2 ± 0.2 Å3 |
Cell temperature | 150 ± 0.02 K |
Ambient diffraction temperature | 150 ± 0.02 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.064 |
Residual factor for significantly intense reflections | 0.062 |
Weighted residual factors for significantly intense reflections | 0.173 |
Weighted residual factors for all reflections included in the refinement | 0.176 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CU-Kα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1507746.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.