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Information card for entry 1507811
Preview
Coordinates | 1507811.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H62 Cl6 N4 O4 S2 |
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Calculated formula | C54 H62 Cl6 N4 O4 S2 |
SMILES | ClC(Cl)Cl.ClC(Cl)Cl.S(c1c2C(=O)N(CCCCCCCC)C(=O)c3c2c2c(c1C#N)C(=O)N(C(=O)c2c(Sc1ccc(cc1)C(C)(C)C)c3C#N)CCCCCCCC)c1ccc(C(C)(C)C)cc1 |
Title of publication | Stepwise cyanation of naphthalene diimide for n-channel field-effect transistors. |
Authors of publication | Chang, Jingjing; Ye, Qun; Huang, Kuo-Wei; Zhang, Jie; Chen, Zhi-Kuan; Wu, Jishan; Chi, Chunyan |
Journal of publication | Organic letters |
Year of publication | 2012 |
Journal volume | 14 |
Journal issue | 12 |
Pages of publication | 2964 - 2967 |
a | 5.884 ± 0.001 Å |
b | 14.26 ± 0.003 Å |
c | 17.526 ± 0.003 Å |
α | 70.967 ± 0.002° |
β | 82.158 ± 0.002° |
γ | 86.783 ± 0.002° |
Cell volume | 1377 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0877 |
Residual factor for significantly intense reflections | 0.0581 |
Weighted residual factors for significantly intense reflections | 0.1276 |
Weighted residual factors for all reflections included in the refinement | 0.144 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.161 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1507811.html
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