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Information card for entry 1508245
Preview
Coordinates | 1508245.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H84 N2 O2 Si4 U2 |
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Calculated formula | C46 H84 N2 O2 Si4 U2 |
SMILES | [U]12345(Oc6c(cccc6C(C)(C)C)C(C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[CH]67[U]89%10%11(Oc%12c(cccc%12C(C)(C)C)C(C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[CH]36[CH]49[CH]5%10[CH]1%11[CH]278 |
Title of publication | Spontaneous reduction and C-H borylation of arenes mediated by uranium(III) disproportionation. |
Authors of publication | Arnold, Polly L.; Mansell, Stephen M.; Maron, Laurent; McKay, David |
Journal of publication | Nature chemistry |
Year of publication | 2012 |
Journal volume | 4 |
Journal issue | 8 |
Pages of publication | 668 - 674 |
a | 9.9492 ± 0.0003 Å |
b | 16.7596 ± 0.0004 Å |
c | 31.5821 ± 0.001 Å |
α | 90° |
β | 94.515 ± 0.003° |
γ | 90° |
Cell volume | 5249.8 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0344 |
Residual factor for significantly intense reflections | 0.0248 |
Weighted residual factors for significantly intense reflections | 0.0444 |
Weighted residual factors for all reflections included in the refinement | 0.0468 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1508245.html
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