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Information card for entry 1508834
Preview
Coordinates | 1508834.cif |
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Original paper (by DOI) | HTML |
Formula | C32 H72 O12 Si8 |
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Calculated formula | C32 H72 O12 Si8 |
SMILES | [Si]12(O[Si]3(O[Si]4(O[Si]5(O[Si](O3)(O[Si](O1)(O[Si](O[Si](O2)(O4)CCCC)(O5)CCCC)CCCC)CCCC)CCCC)CCCC)CCCC)CCCC |
Title of publication | X-ray Crystal Structures, Packing Behavior, and Thermal Stability Studies of a Homologous Series ofn-Alkyl-Substituted Polyhedral Oligomeric Silsesquioxanes |
Authors of publication | El Aziz, Youssef; Bassindale, Alan R.; Taylor, Peter G.; Stephenson, Richard A.; Hursthouse, Michael B.; Harrington, Ross W.; Clegg, William |
Journal of publication | Macromolecules |
Year of publication | 2013 |
Journal volume | 46 |
Journal issue | 3 |
Pages of publication | 988 |
a | 9.5947 ± 0.0009 Å |
b | 9.6312 ± 0.0008 Å |
c | 13.6739 ± 0.0013 Å |
α | 75.877 ± 0.006° |
β | 80.373 ± 0.004° |
γ | 80.569 ± 0.005° |
Cell volume | 1198.09 ± 0.19 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1123 |
Residual factor for significantly intense reflections | 0.0599 |
Weighted residual factors for significantly intense reflections | 0.1185 |
Weighted residual factors for all reflections included in the refinement | 0.1372 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1508834.html
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