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Information card for entry 1508838
Preview
Coordinates | 1508838.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H104 O12 Si8 |
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Calculated formula | C48 H104 O12 Si8 |
SMILES | [Si]12(O[Si]3(O[Si]4(O[Si](O1)(O[Si]1(O[Si](O[Si](O3)(O[Si](O2)(O1)CCCCCC)CCCCCC)(O4)CCCCCC)CCCCCC)CCCCCC)CCCCCC)CCCCCC)CCCCCC |
Title of publication | X-ray Crystal Structures, Packing Behavior, and Thermal Stability Studies of a Homologous Series ofn-Alkyl-Substituted Polyhedral Oligomeric Silsesquioxanes |
Authors of publication | El Aziz, Youssef; Bassindale, Alan R.; Taylor, Peter G.; Stephenson, Richard A.; Hursthouse, Michael B.; Harrington, Ross W.; Clegg, William |
Journal of publication | Macromolecules |
Year of publication | 2013 |
Journal volume | 46 |
Journal issue | 3 |
Pages of publication | 988 |
a | 8.664 ± 0.004 Å |
b | 9.475 ± 0.004 Å |
c | 20.486 ± 0.008 Å |
α | 78.122 ± 0.004° |
β | 80.489 ± 0.004° |
γ | 85.953 ± 0.004° |
Cell volume | 1621.9 ± 1.2 Å3 |
Cell temperature | 210 ± 2 K |
Ambient diffraction temperature | 210 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0964 |
Residual factor for significantly intense reflections | 0.0602 |
Weighted residual factors for significantly intense reflections | 0.1611 |
Weighted residual factors for all reflections included in the refinement | 0.1865 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
Diffraction radiation wavelength | 0.6946 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1508838.html
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