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Information card for entry 1512316
Preview
Coordinates | 1512316.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C77 H104 F12 N2 O20 P2 |
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Calculated formula | C77 H104 F12 N2 O20 P2 |
SMILES | [P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].O(c1c2cc(OCCOC)c(c1)Cc1cc(OCCOC)c(cc1OCCOC)Cc1cc(OCCOC)c(cc1OCCOC)Cc1cc(OCCOC)c(cc1OCCOC)Cc1cc(OCCOC)c(cc1OCCOC)C2)CCOC.[n+]1(ccc(cc1)c1cc[n+](cc1)C)C |
Title of publication | Redox-Responsive Complexation between a Pillar[5]arene with Mono(ethylene oxide) Substituents and Paraquat |
Authors of publication | Chi, Xiaodong; Xue, Min; Yao, Yong; Huang, Feihe |
Journal of publication | Organic Letters |
Year of publication | 2013 |
Journal volume | 15 |
Journal issue | 18 |
Pages of publication | 4722 |
a | 12.7231 ± 0.0006 Å |
b | 18.9237 ± 0.0008 Å |
c | 19.2705 ± 0.0008 Å |
α | 66.042 ± 0.004° |
β | 71.703 ± 0.004° |
γ | 73.615 ± 0.004° |
Cell volume | 3961.2 ± 0.3 Å3 |
Cell temperature | 170 ± 2 K |
Ambient diffraction temperature | 170 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0565 |
Residual factor for significantly intense reflections | 0.044 |
Weighted residual factors for significantly intense reflections | 0.1066 |
Weighted residual factors for all reflections included in the refinement | 0.1163 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1512316.html
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Users of the data should acknowledge the original authors of the
structural data.