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Information card for entry 1513014
Preview
| Coordinates | 1513014.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54 H47 N O5 P2 Ru |
|---|---|
| Calculated formula | C54 H47 N O5 P2 Ru |
| SMILES | [Ru]12([N](c3c(O1)cccc3)=Cc1c2cc(cc1)C(=O)OC)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)C#[O].OCC |
| Title of publication | A closer look at the formation of bicyclometalated and cyclometalated ruthenium carbonyl complexes |
| Authors of publication | Soumik Mandal; Dipravath K. Seth; Parna Gupta |
| Journal of publication | Inorganica Chimica Acta |
| Year of publication | 2013 |
| Journal volume | 397 |
| Pages of publication | 10 - 20 |
| a | 11.9458 ± 0.0005 Å |
| b | 12.9001 ± 0.0006 Å |
| c | 17.0701 ± 0.0008 Å |
| α | 71.556 ± 0.002° |
| β | 72.86 ± 0.002° |
| γ | 63.978 ± 0.002° |
| Cell volume | 2204.62 ± 0.18 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.065 |
| Residual factor for significantly intense reflections | 0.0488 |
| Weighted residual factors for significantly intense reflections | 0.1236 |
| Weighted residual factors for all reflections included in the refinement | 0.1309 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1513014.html
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