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Information card for entry 1513253
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Coordinates | 1513253.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | tetrakis((μ~3~-iodo)-piperidine copper(I)) |
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Formula | C20 H44 Cu4 I4 N4 |
Calculated formula | C20 H44 Cu4 I4 N4 |
SMILES | [I]12[Cu]3456([I]7[Cu]8914([I]1[Cu]4578([I]3[Cu]26914[NH]1CCCCC1)[NH]1CCCCC1)[NH]1CCCCC1)[NH]1CCCCC1 |
Title of publication | Optimizing the accuracy and precision of the single-pulse Laue technique for synchrotron photo-crystallography |
Authors of publication | Kamiński, Radosław; Graber, Timothy; Benedict, Jason B.; Henning, Robert; Chen, Yu-Sheng; Scheins, Stephan; Messerschmidt, Marc; Coppens, Philip |
Journal of publication | Journal of Synchrotron Radiation |
Year of publication | 2010 |
Journal volume | 17 |
Journal issue | 4 |
Pages of publication | 479 - 485 |
a | 14.6049 ± 0.0012 Å |
b | 14.6049 ± 0.0012 Å |
c | 7.5464 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1609.7 ± 0.3 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 5 |
Space group number | 86 |
Hermann-Mauguin space group symbol | P 42/n :2 |
Hall space group symbol | -P 4bc |
Residual factor for all reflections | 0.031 |
Residual factor for significantly intense reflections | 0.0239 |
Weighted residual factors for significantly intense reflections | 0.0549 |
Weighted residual factors for all reflections included in the refinement | 0.0602 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.106 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1513253.html
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