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Information card for entry 1513271
Preview
Coordinates | 1513271.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H80 Cu N8 O8 |
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Calculated formula | C64 H80 Cu N8 O8 |
SMILES | c12c3c(c4=Nc5c6c(c7N=c8c9c(c%10N=c%11c%12c(c(=N2)n%11[Cu]([n]14)([n]8%10)n57)c(ccc%12OCCCC)OCCCC)c(ccc9OCCCC)OCCCC)c(ccc6OCCCC)OCCCC)c(ccc3OCCCC)OCCCC |
Title of publication | Solution-Processed Microwires of Phthalocyanine Copper(II) Derivative with Excellent Conductivity |
Authors of publication | Zhang, Yu; Zhang, Zuolun; Zhao, Yunfeng; Fan, Yan; Tong, Tianjian; Zhang, Hongyu; Wang, Yue |
Journal of publication | Langmuir |
Year of publication | 2009 |
Journal volume | 25 |
Journal issue | 11 |
Pages of publication | 6045 - 6048 |
a | 13.727 ± 0.003 Å |
b | 26.661 ± 0.005 Å |
c | 16.663 ± 0.003 Å |
α | 90° |
β | 101.32 ± 0.03° |
γ | 90° |
Cell volume | 5980 ± 2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.2664 |
Residual factor for significantly intense reflections | 0.1324 |
Weighted residual factors for significantly intense reflections | 0.2273 |
Weighted residual factors for all reflections included in the refinement | 0.2795 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.086 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1513271.html
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