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Information card for entry 1513445
Preview
Coordinates | 1513445.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 2011mg01mcf01 |
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Formula | C70 H78 N2 |
Calculated formula | C70 H78 N2 |
SMILES | CC(C1=C=C(C#Cc2cccc(n2)C#CC(=C=C(C#CC#CC(=C=C(C#Cc2nc(C#CC(=C=C(C#CC#C1)C(C)(C)C)C(C)(C)C)ccc2)C(C)(C)C)C(C)(C)C)C(C)(C)C)C(C)(C)C)C(C)(C)C)(C)C |
Title of publication | Preparation and Characterization of a Halogen-Bonded Shape-Persistent Chiral Alleno-acetylenic Inclusion Complex. |
Authors of publication | Castro-Fernández, Silvia; Lahoz, Inmaculada R.; Llamas-Saiz, Antonio L; Alonso-Gómez, José Lorenzo; Cid, María-Magdalena; Navarro-Vázquez, Armando |
Journal of publication | Organic letters |
Year of publication | 2014 |
Journal volume | 16 |
Journal issue | 4 |
Pages of publication | 1136 - 1139 |
a | 33.2464 ± 0.0015 Å |
b | 6.863 ± 0.0005 Å |
c | 31.448 ± 0.002 Å |
α | 90° |
β | 109.185 ± 0.003° |
γ | 90° |
Cell volume | 6777 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 3 |
Space group number | 5 |
Hermann-Mauguin space group symbol | C 1 2 1 |
Hall space group symbol | C 2y |
Residual factor for all reflections | 0.0911 |
Residual factor for significantly intense reflections | 0.0561 |
Weighted residual factors for significantly intense reflections | 0.1434 |
Weighted residual factors for all reflections included in the refinement | 0.1582 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.93 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1513445.html
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Users of the data should acknowledge the original authors of the
structural data.